Numerical Investigation of the System-Matrix Method for Higher-Order Probe Correction in Spherical Near-Field Antenna Measurements

[摘要] The system-matrix method for higher-order probe correction in spherical near-field scanning isbased on a renormalized least-squares approach in which the normal matrix closely resembles theidentity matrix when most of the energy of the probe pattern resides in the first-order modes. Thismethod will be “stressed-tested” in the present paper by employing probes for which up to 49%of the pattern energy resides in the higher-order modes. The condition number of the resultingnormal matrix will be computed, and its “distance” from the identity matrix displayed. It is alsoshown how the condition number of the normal matrix can be further reduced.

[学科分类] 电子、光学、磁材料