Optimal Detector Design for On-line Testing of Linear Analog Systems

[摘要] The design of integrated fault detector for on-line testing of linear analog systems isdiscussed in this paper. The method consists in a concurrent processing of available thenode voltage signals to provide a residual on-line, that carries information about thefaults. Contrary to the few previous works dealing with the particular case of statevariable analog systems, the method proposed here is useable without limitation fora larger class of linear analog systems, even when the state variables are not availableas measurable voltages. For this purpose, an algorithm providing an extended statespace model for any linear analog system from its netlist description is developedand implemented.

[学科分类] 电子、光学、磁材料