Testing and Diagnosing Dynamic Reconfigurable FPGA

[摘要] Dynamic reconfigurable field-programmable logic arrays (FPGAs) are receiving notableattention because of their much shorter reconfiguration time as compared withtraditional FPGAs. The short reconfiguration time is vital to applications such asreconfigurable computing and emulation. We show in this paper that testing anddiagnosis of the FPGA also can take advantage of its dynamic reconfigurability. Wefirst propose an efficient methodology for testing the interconnects of the FPGA, thenpresent several universal test and diagnosis approaches which cover all functional unitsof the FPGA. Experimental results show that our approach significantly reduces thetesting time, without additional cost for diagnosis.

[学科分类] 电子、光学、磁材料