New Self-dual Circuits for Error Detection and Testing

[摘要] In this paper new methods for the transformation of a given combinational circuit intoa self-dual circuit based on the notion of a self-dual complement are investigated. Thelarge variety of self-dual complements can be utilized to optimize the transformed self-dualcircuit. Self-dual duplication and self-dual parity prediction are considered indetail. As a method for the reduction of self-dual outputs, output space compaction ofself-dual outputs is considered. For the first time we also describe in this paper how aself-dual circuit can be modified into a self-dual fault-secure circuit.

[学科分类] 电子、光学、磁材料