Signal Coding and CMOS Gates for Combinational Functional Blocks of Very Deep Submicron Self-checking Circuits

[摘要] In this paper we propose signal coding and CMOS gates that are suitable to self-checkingcircuits with combinational functional blocks implemented also by next generation,very deep submicron technology. In particular, our functional blocks satisfythe Strongly Fault-Secure property with respect to a wide set of possible, internalfaults including not only conventional stuck-ats, but also transistor stuck-ons, transistorstuck-opens, resistive bridgings, delays, crosstalks and transient faults, that are verylikely to affect next generation ICs. Compared to alternative, existing solutions, thatproposed here does not imply any critical constraint on the circuit electrical parameters.Therefore, it is suitable to be adopted to design very deep submicron self-checking circuitswhich, compared to todays' circuits, will present significantly increased sensitivityto parameter variations occurring during fabrication.

[学科分类] 电子、光学、磁材料