Antirandom Testing: A Distance-Based Approach

[摘要] Random testing requires each test to be selected randomly regardless of the tests previouslyapplied. This paper introduces the concept of antirandom testing where each test applied ischosen such that its total distance from all previous tests is maximum. This spans the testvector space to the maximum extent possible for a given number of vectors. An algorithmfor generating antirandom tests is presented. Compared with traditional pseudorandom testing,antirandom testing is found to be very effective when a high-fault coverage needs to beachieved with a limited number of test vectors. The superiority of the new approach is evenmore significant for testing bridging faults.

[学科分类] 电子、光学、磁材料