Effects of Refiring Processes on Electrical and StructuralProperties of Thick-Film Resistors

[摘要] in order to analyze the influence of the refiring processes in thick film resistors, electrical and structural propertiesof resistors, refired up to ten times, through the original profile, were compared.The apparent sheet resistivity and TCR were measured as a function of the number of the firing cycles, and theseelectrical characteristics analyzed in connection with observations of structural and chemical modificationsevidenced through X-ray diffraction, SEM inspection and microprobe analysis.Marked effects were observed, such as segregation of the conductive grains in the resistor thickness, chemicalreactions of glass-modifiers with glass, crystallization of new phases, together with substrate/thick-film interactions.It is found that in some cases (e.g. for DP 1400 resistor series) the phenomena induced by refiring are few andsimple enough for us to interprete the corresponding electrical modifications, while in other systems the presence ofmany competitive chemicophysical effects inhibit their unambiguous correlation with the electrical properties ofthese resistors.

[学科分类] 工程和技术（综合）