An Iterative Approach to Improve Images of Multiple Targets and Targets with Layered or Continuous Profile

[摘要] An iterative approach, based on the linear sampling method (LSM) and the contrast source inversion (CSI) method, is proposed to improve the recovered images of multiple targets and targets with layered or continuous profile, including shape and distribution of electric properties. The difficulties in dealing with large targets or high contrast are partly overcome with this approach. Typical targets studied in the literatures are chosen for simulations and comparison.

[学科分类] 电子、光学、磁材料