Test signal generation for analog circuits

[摘要] In this paper a new test signal generation approachfor general analog circuits based on the variational calculusand modern control theory methods is presented. The computedtransient test signals also called test stimuli are optimalwith respect to the detection of a given fault set by means of apredefined merit functional representing a fault detection criterion.The test signal generation problem of finding optimaltest stimuli detecting all faults form the fault set is formulatedas an optimal control problem. The solution of the optimalcontrol problem representing the test stimuli is computed usingan optimization procedure. The optimization procedureis based on the necessary conditions for optimality like themaximum principle of Pontryagin and adjoint circuit equations.

[学科分类] 电子、光学、磁材料