Spectral Signature Analysis – BIST for RF Front-Ends

[摘要] In this paper, the Spectral Signature Analysisis presented as a concept for an integrable self-test system(Built-In Self-Test – BIST) for RF front-ends is presented.It is based on modelling the whole RF front-end (transmitterand receiver) on system level, on generating of a SpectralSignature and of evaluating of the Signature Response.Because of using multi-carrier signal as the test signature,the concept is especially useful for tests of linearity and frequencyresponse of front-ends. Due to the presented methodof signature response evaluation, this concept can be used forBuilt-In Self-Correction (BISC) at critical building blocks.

[学科分类] 电子、光学、磁材料