ESD compact-simulation: investigation of inverter failure

[摘要] An ESD failure occurring inside the core circuitryknown as “inverter failure" will be presented and analysed inthis paper. The compact model utilised for this investigationis shortly presented. It will be shown that not only propertiesof the failed structure are relevant, but also surrounding circuitry.So the gate of an inverter will be connected during thesimulations in diverse ways to VDD and VSS. The differentpossibilities of influence of pre drivers can be appraised inthis way. In order to achieve a detailed understanding of theindividual failure, it is necessary to include ambient circuitryas well as parasitics like resistors and capacitances.

[学科分类] 电子、光学、磁材料