Estimation of the threat of IEMI to complex electronic systems

[摘要] The threat of ultra wideband (UWB) sources is interesting for militaryissues. This paper summarizes information concerning the voltages generatedfrom some commercially available UWB generator systems and their producedelectromagnetic fields. The paper focuses on the coupling of UWB fieldsinto electronic equipment and discusses possible modeling and measurementtechniques to estimate such a threat for modern ships. An evaluationprocedure for the determination of the induced voltage at the input ofan electronic component is presented. This method is based on thecomputation of the internal electric field and the measurements ona test network, which is similar to the structure of the steeringcontrol cabling. It allows the estimation of the potential threatfor the ship's electronic equipment due to the exposal to UWB emitting sources.

[学科分类] 电子、光学、磁材料