Reproducing system-level bulk current injection test in direct power injection setup for multiple-port DUTs

[摘要] Many investigations have been published on the transferability of RFimmunity test results between system and IC-levels. The RF signal level atDUT (Device under Test) inputs, i.e. either RF voltage amplitude or RF inputcurrent, is used as a reference value for the load on the DUT. Existingapproaches analyze the DUT response as a function of the RF signal level ata single input pin, e.g. supply voltage. Sufficient accuracy of such anapproach could be shown in several cases, but results are not sufficient asa general solution for complex DUT. This paper proposes both theoreticalanalysis and practical implementation of a DPI setup, where a disturbance,equivalent to system-level BCI setup, can be delivered to multiple DUT inputports.

[学科分类] 电子、光学、磁材料