Breakdown behavior of electronics at variable pulse repetition rates

[摘要] The breakdown behavior of electronics exposed to single transientelectromagnetic pulses is subject of investigations for several years.State-of-the-art pulse generators additionally provide the possibility togenerate pulse sequences with variable pulse repetition rate. In thisarticle the influence of this repetition rate variation on the breakdownbehavior of electronic systems is described. For this purposemicrocontroller systems are examined during line-led exposure to pulses withrepetition rates between 1 KHz and 100 KHz. Special attention is given tobreakdown thresholds and breakdown probabilities of the electronic devices.

[学科分类] 电子、光学、磁材料