Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

[摘要] In this article, the error-corrected determination of complexscattering parameters of multi-port devices by means of a 2-portvector network analyzer is presented. As only two ports of thedevice under test can be connected to the analyzer ports at atime, the remaining device ports have to be terminated by externalreflections. In order to measure the scattering parameters of theDUT without the influence of systematic errors and of the externalterminations, an error correction has to be performed besides thecalibration. For this purpose, the application of the multi-portprocedure is presented. This method has the advantage, that theexternal reflective terminations can be chosen arbitrarily.Furthermore, these terminations can be unknown except for one. Anautomatized measurement system based on a switching network isshown, which is optimized for the measurement of planar microwavecircuits. An error model for the description of the measurementsetup as well as a calibration procedure for the elimination ofthe systematic errors are presented.

[学科分类] 电子、光学、磁材料