Usage of the contactless vector network analysis with varying transmission line geometries

[摘要] The scattering parameters of embedded devices can be measured by means ofcontactless vector network analysis. To achieve accurate measurement results,the contactless measurement setup has to be calibrated. However, if thesubstrate material or the planar transmission lines on the substrate changes,a new calibration is necessary. In this paper a method will be examined,which reduces the number of calibration cycles by using a database.Analytical results show that by using this database method, errors occurwhich depend on the coupling coefficients and on the load impedances of thecontactless probes. However, the measurement results show deviations smallerthan 7% in comparison to the conventional vector network analysis, which issufficient for the most pratical applications.

[学科分类] 电子、光学、磁材料