Surface photocurrent nonuniformities in MSM detectors fabricated in gallium nitride heteroepitaxial layers
[摘要]
[发布日期] [发布机构]
[效力级别] [学科分类] 光谱学
[关键词] metal–semiconductor–metal (MSM);UV detector;gallium nitride;optical beam induced current (OBIC);scanning surface potential microscopy (SSPM) [时效性]
