Influence of high pressure annealing on electrical properties of surface layer of neutron irradiated or germanium-doped Czochralski-grown silicon
[摘要]
[发布日期] [发布机构]
[效力级别] [学科分类] 光谱学
[关键词] germanium-doped silicon;neutron-irradiated silicon;defects [时效性]
