Application of X-ray topography to USSR and Russian space materials science
[摘要]
[发布日期] [发布机构]
[效力级别] [学科分类] 数学（综合）
[关键词] X-RAY TOPOGRAPHY;SPACE MATERIALS SCIENCE;MICROGRAVITY;SEMICONDUCTOR SINGLE CRYSTALS;GROWTH STRIATIONS;DEFECTS;PHYSICAL MODELLING;THERMOGRAVITATIONAL CONVECTION [时效性]
