A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

[摘要] In this report, it was found that the Napierian logarithm of the electrical resistance is proportional to the reciprocal thickness for the platinum nanofilms. A new method was proposed to determine the thickness of platinum nanofilm simply by measuring its electrical resistance, which is fast and cost effective.

[学科分类] 分析化学