Microstructural studies on variation of defect parameters in Zr�?�Sn alloys and their transition with interchange of solvent and solute in Zr�?�Ti and Ti�?�Zr alloy systems by modified Rietveld method and Warren�?�Averbach method

[摘要] The effects of deformation and the transition of microstructural defect states with the interchange of solvent and solute in Tiâ€�?�Zr and Zrâ€�?�Ti alloys of six different compositions and Zrâ€�?�Sn alloys in three different compositions have been investigated by X-ray diffraction line profile analysis. The detailed analysis of the X-ray powder diffraction line profiles was interpreted by Fourier line shape analysis using modified Rietveld method and Warrenâ€�?�Averbach method taking silicon as standard. Finally the microstructural parameters such as coherent domain size, microstrains within domains, faulting probability and dislocation density were evaluated from the analysis of X-ray powder diffraction data of Zr base Sn, Ti and Ti base Zr alloys by modified Rietveld powder structure refinement. This analysis confirms that the growth fault, ð›�?, is totally absent or negligibly present in Zrâ€�?�Ti, Tiâ€�?�Zr and Zrâ€�?�Sn alloy systems, because the growth fault, ð›�?, has been observed to be either negative or very small for these alloy systems. This analysis also revealed that the deformation fault, ð›�?, has significant presence in titanium-base zirconium alloy systems but when zirconium content in the matrix goes on increasing beyond 50%, this faulting behaviour suffers a drastic transition and faulting tendency abruptly drops to a level of negligible presence or zero. This tendency has also been observed in Zrâ€�?�Sn alloys signifying high stacking fault energy. Therefore, Zr and Zr-base alloys having high stacking fault energy can be used as hard alloys in nuclear technology at high temperature.

[学科分类] 材料工程

[关键词] X-ray diffraction;Fourier line shape analysis;modified Rietveld method;Warrenâ€�?�Averbach method;microstructural defect parameters;Ti and Zr base alloys.