The selection and single event upset testing of a DSP processor for a LEO satellite

[摘要] ENGLISH ABSTRACT:After successful use of a DSP processor onboard the SUNSAT satellite, the need arose fora faster floating-point processor. A list of possible processors was generated from variousselection criteria. Two suitable DSP processors were chosen, and because no radiationinformation was available for one of them, the decision was made to perform radiationtests on it. The procedures used to test the processor are described in detail so the samemethods can be used for future radiation tests. An error detection and correction circuitwas implemented to check and correct upsets in the on-chip memory of the DSP processor.This ensures that the processor code and data stays intact.

[发布机构] Stellenbosch University