APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY

[摘要] A laser beam (24) is focused to a small spot size onto a sample (14). A silver coated metal probe (16) has its tip positioned within the beam, close to or contacting the sample (14). A reflected Raman signal (28) is detected. The metal probe (16) enhances the Raman signal, and provides high resolution. It may be cantilevered, and scanned across the surface of the sample (14), with its position monitored via optical means (20, 22).