A low-cost built-in self-test for CP-PLL based on TDC

[摘要] References(11)To ensure qualification of charge-pump locked-loop (CP-PLL), a complete built-in self-test (BIST) scheme should provide functions of measurement of the clock jitter and detection of faults in CP-PLL. This paper proposes a low cost BIST structure providing both the faults detected and timing jitter measured. The structure based on the proposed time-to-digital converter (TDC), which has high resolution and most blocks of TDC are based on the existing blocks in CP-PLL, reduces the test cost and area overhead. The circuit has been designed and simulated in TSMC 0.13 µm CMOS process. The simulation results show that the resolution is about 0.9865 ps and the fault coverage is 98.33%.

[学科分类] 电子、光学、磁材料

[关键词] BIST;CP-PLL;jitter measurement;fault coverage