已收录 268921 条政策
 政策提纲
  • 暂无提纲
Analysis and comparison of metrology methods for quantifying micro-endmills
[摘要] (cont.) Furthermore, all four measurement techniques were found to be more accurate when measuring smaller tools than when measuring larger tools; in particular, SEM measurements of large tools suggested a high probability of incorrect measurement. The findings presented here have the potential to foster further discussion and use of on-machine measurement systems in microscale metrology over the currently prevailing microscopy methods, in particular SEM.
[发布日期]  [发布机构] Massachusetts Institute of Technology
[效力级别]  [学科分类] 
[关键词]  [时效性] 
   浏览次数:3      统一登录查看全文      激活码登录查看全文