An investigation of the mechanism underlying delayed electron emission

[摘要] Electron emission from aluminum was observed during isochronal annealing after deformation at a low temperature, and during isothermal annealing after quenching from a high temperature. The results were compared with theory. Approximate values of the activation energies for the process were derived. A possible mechanism underlying the phenomenon was suggested. The electrical resistance of aluminum wires was also measured during isochronal annealing after deformation at a low temperature. A mechanism was suggested to explain the results.

[发布机构] Rice University