Templated dewetting of thin solid films

[摘要] (cont.) During the solid-state dewetting process, the growth of holes in the film is accompanied by material accumulation along the edge of the hole. Investigation of the dewetting edge at early stages revealed that the accumulation occurs unevenly in individual grains. Electron backscatter diffraction revealed that the unevenness is not due to grain orientation.

[发布机构] Massachusetts Institute of Technology