Physical-aware gating element insertion for thermal-safe scan shift operation

[摘要] Additional gating elements are inserted at the outputs of scan flip-flop to freeze unnecessary transitions from scan flip-flops to combinational logic such that the hot temperature is avoided during scan shift. This paper presents a new physical-aware gating element insertion method performed after initial cell placement while satisfying timing and placement density constraints, thus it avoids hotspots during scan shift operation.

[学科分类] 电子、光学、磁材料

[关键词] low power testing;scan test;gating element insertion;thermal-safe scan shift operation