A highly reliable butterfly PUF in SRAM-based FPGAs

[摘要] This paper presents a butterfly physically unclonable function (PUF) implementation in SRAM-based field programmable gate arrays (FPGAs). To avoid output instability, we propose a delay difference test to identify reliable slices (mapped to which butterfly PUF cells are highly reliable) and then PUF reliability is significantly improved by selective mapping PUF cells to reliable slices, which is validated in experimental results.

[学科分类] 电子、光学、磁材料

[关键词] physically unclonable function (PUF);SRAM-based FPGAs;delay difference test;selective mapping;highly reliable