Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages

[摘要] In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG–DTA) studies. The tracking time was different for a.c. and d.c. voltages.

[学科分类] 材料工程

[关键词] Silicone rubber;surface degradation;tracking;WAXD;TG–DTA.