An investigation of the effects of x-radiation on the electrical characteristics of dielectrics

[摘要] An Investigation into the effects of X-radiation on the electrical properties of dielectrics is described In this paper. Experiments were conducted to determine the amount of ionization in the dielectric as a function of the intensity of X-radiation. The possibility that the dielectric constant of such materials would change appreciably under radiation was also investigated. Going on the assumption that some ionization of the dielectric material did occur, recovery time measurements were attempted. The experimental methods, the methods of calculation, and the results of these experiments are presented and discussed. Various pieces of equipment constructed for use in the investigation are described and discussed in the three Appendices at the end of this paper. The results of the tests made are somewhat inconclusive, but they may be stated briefly. The amount of ionization in the dielectric material was not determined. No change of dielectric constant under radiation was detected, i.e., no change was detected within the accuracy of the measuring apparatus. The recovery time of the material under test, if different from zero, was obscured by the recovery time of the measuring system used. A bibliography of books and papers containing information pertinent to the subject of this paper is included at the end of tho text of the paper.

[发布机构] Rice University