Electrical properties of thin film carbon(60) (fullerenes, excimer lasers)

[摘要] The fabrication of solid C$sb{60}$ device structures by vacuum sublimation methods is described. The experimentally determined threshold of intrinsic conductivity of solid C$sb{60}$ is $sim$1.5eV. The observations of ohmic contact and photoinduced voltages in C$sb{60}$ sandwich structures are observed and explained. The diffusion of silver into C$sb{60}$ thin films is quantitatively studied. The activation energy for diffusion of silver into C$sb{60}$ is estimated at 2.5 $pm$ 0.5 eV. Experiments on KrF excimer laser-induced ablation and the laser-induced conductivity change in solid C$sb{60}$ are done for the first time.

[发布机构] Rice University

[效力级别] Electronics