Material Microcharacterization Collaboratory.

[摘要] The Center for Microanalysis of Materials (CMM) is a user-oriented and user-friendly facility that provides the modern analytical capabilities essential to today's materials science. The Center is an integral part of the Frederick Seitz Materials Research Laboratory on the campus of the University of Illinois at Urbana-Champaign. The CMM emphasizes the microstructural and microchemical composition of materials; chemistry and electronics of surfaces; crystal structures; phase transitions and defect structures of materials; the relationship between structure and properties of solids. By using the center, materials researchers can access over 30 major instruments in the areas of electron microscopy, scanning probes, surface microanalysis, X-ray diffraction, and back-scattering spectroscopy's. The breadth of instrumentation available through the center enables researchers to find the best combination of analytical techniques for their specific needs.

[发布机构] Technical Information Center Oak Ridge Tennessee

[学科分类] 工程和技术（综合）

[关键词] Microanalysis;Materials tests;Micromagnetic properties;Microchemical properties;Electron microscopy