Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-Ray Fluoresence: Preprint.

[摘要] Presented at the 2001 NCPV Program Review Meeting: Atomic density profile of selected atomic species in series of CdS/Zn2SnO4 junctions were studied by ADXRF.

[发布机构] Technical Information Center Oak Ridge Tennessee

[学科分类] 工程和技术（综合）

[关键词] Meetings;X-ray flourescence;Annealing;Junctions;Heat treatment