Evaluation of System Reliability and Heavy Ion Angular Effects
[摘要] Microsemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data is presented. SEU data analysis includes: 1) Evaluation of heavy-ion beam angular effects (rectangular parallel pipe (RPP) or no RPP), 2) Importance of finding linear energy transfer (LET) onset (L0), 3) Comparison of prediction rate techniques.
[发布日期] 2019-02-05 [发布机构]
[效力级别] [学科分类] 电子与电气工程
[关键词] EXTRAPOLATION;EXTRATERRESTRIAL RADIATION;MICROSEISMS;FIELD-PROGRAMMABLE GATE ARRAYS;RELIABILITY ANALYSIS;SINGLE EVENT UPSETS;CHIPS (ELECTRONICS);FAILURE;LINEAR ENERGY TRANSFER (LET);PREDICTION ANALYSIS TECHNIQUES [时效性]
